XRFWIN Light for WDS

XRFWIN Light for WDS permits fully-integrated direct control of WDS spectrometers to acquire qualitative and quantitative analysis data, but does not provide comprehensive analysis of the data. The exception to this is the capability of performing the intermediate analysis step of drift correction. Drift correction is included in the Light version of the software to simplify management of instrument data. Though only used as an example, this page features dialogue boxes for the Rigaku S/MAX 3080. In principle, fully integrated plug-in instrument drivers allow support of any WDS spectrometer.

Qualitative Analysis

All WDS spectrometers can perform qualitative analysis where x-ray intensity is acquired as a function of analyzing crystal angle or wavelength. This permits elements present in a specimen to be identified. Qualitative scans are acquired in XRFWIN Light by defining a qualitative run template that specifies instrument settings for one or more scans. As with all other aspects of instrument control, instrument-dependant settings are fully integrated with general settings for acquiring qualitative scans.

Figure 3.1. Qualitative Run Template settings for acquiring a qualitative scan from the Rigaku S/MAX 3080.

The acquired qualitative scan is then displayed in an interactive graph allowing examination of details of the data. .

Figure 3.2. Qualitative scan of XRFWIN Light for WDS.

Quantitative Analysis

Automatic quantitative analysis is performed with the XRFWIN material. The material includes the analytes to be analysed for, and a list of standards for instrument drift correction. As with all other features of XRFWIN, instrument-dependent settings are fully integrated into the analyte settings of the material user interface.

Figure 3.3. The XRFWIN Light for WDS material settings.

Results are displayed in a comprehensive list of tables as the data is acquired. Full cutting, copying, pasting, printing, and exporting functions are available. .

Figure 3.4. Quantitative analysis results in XRFWIN Light for WDS.

Quantitative results for one spectrometer can be observed in XRFWIN configured for another spectrometer. A material configured for one spectrometer can be easily reconfigured for another spectrometer machine or model allowing easy exchange of data and analysis procedures between spectrometer installations.

Instrument Drivers and Tools

Software instrument drivers provide full instrument control fully integrated into the XRFWIN Light user interface. Instrument-dependant settings are defined in the same place other qualitative and quantitative analysis settings are specified.

Figure 3.5. Rigaku S/MAX 3080 instrument-specific settings specified with other analyte settings for quantitative analysis.

In addition to full instrument control, XRFWIN Light provides a variety of tools for working with the instrument. Specific tools available depend on the instrument, but all WDS spectrometers include a chart recorder useful when aligning analyzing crystals.

Figure 3.6. Chart Recorder tool for the Rigaku S/MAX 3080.

In addition, peaks marked in a qualitative scan can be utilised by the crystal offset tool that allows a small analyzing crystal misalignment to be accounted for in software.

Figure 3.7. Crystal offset determination tool

Contact Omni Scientific Instruments, Inc. for details of support provided your spectrometer. In most cases a software driver can be made available on demand for instruments not currently supported.

Figure 3.8. Spectrometer Run Settings dialogue box for the S/MAX 3080. Each sample position can be assigned a qualitative run template, quantitative material, or both.

When performing a run of the spectrometer, the Spectrometer Run Settings dialogue box allows the operator to assign samples to the various sample holder positions and stipulate the analysis to be performed. Each sample can be assigned a different kind of analysis.

Features

The following outline features of XRFWIN Light for WDS by classification

Overall

Runs under Windows 95, 98, NT 4, 2000, ME, and XP operating systems
Graphical user interface makes use of program more intuitive
Context sensitive help systems allows you to answer questions faster

Copy, print, or export to a text file almost any item of quantitative and qualitative analysis
Multiple document interface allows more productive use of time

Instrumentation

Virtually any WDS spectrometer can be supported using plug-in instrument drivers.
Instrument control is achieved from within the software, simplifying instrument management
Instrument-dependant settings fully integrated with general analyte and qualitative scan settings, simplifying operation of spectrometer

Chart recorder tool to assist in aligning analyzing crystals
Crystal offset tool to correct for residual crystal misalignment
Instrument sample changer accurately portrayed in software, simplifying set-up and execution of runs

Qualitative Analysis

Qualitative Run Template simplifies execution of repeat qualitative scans
Powerful graph display allows detailed examination of data

Customize graph display settings to suite your environment
Full printing, export, and clipboard copying capability

Quantitative Analysis

XRFWIN material simplifies management of instrument and data
Material stored with acquired data guarentees accurate reccord of all measurement conditions
Integration of standards in material simplifies management of standards
Smart analyte ordering during acquisition to minimize instrument wear
Include any number of materials in a given run of the spectrometer
Run calibration standards at any time with the click of a button.

Instrument drift corrections obtained from drift standards included in run or a material log file.
Drift corrections integrated into material
Fully-integrated analyzing crystal angle determination tool simplifies setting analyte characteristic line angle
Results presented in easy-to-read tables
Customize display settings to suite your environment
Full printing, copying, and clipboard copying capability

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