XRFWIN Basic for WDS

XRFWIN Basic for WDS permits analysis of WDS XRF data, but does not provide direct instrument control. XRFWIN Basic provides tools for managing the spectrometer, and performing qualitative and quantitative analysis. Data is supplied to the software by pasting or importing.

Qualitative Analysis

All WDS spectrometers can perform qualitative analysis where x-ray intensity is acquired as a function of analyzing crystal angle or wavelength. This permits elements present in a specimen to be identified. Once a qualitative scan has been pasted or imported into XRFWIN Basic for WDS, the qualitative scan is displayed in an interactive graph allowing examination of details of the data. XRFWIN has tools for performing both qualitative and quantitative analysis of the qualitative scan..

Figure 4.1. Qualitative scan of XRFWIN Basic for WDS.

The qualitative analysis results of Figure 4.1 are obtained with the Identify Lines tool.

Figure 4.2. Identify Lines Tool of XRFWIN Basic. Results are presented with an estimate of reliability.

Using quantitative analysis materials defined for XRFWIN Basic, it is also possible to perform quantitative analysis of the qualitative scan.

Quantitative Analysis

Automatic quantitative analysis is performed with the XRFWIN material. The material includes the analytes to be analysed for, known constituents, a list of standards for calibration and instrument drift correction, and the matrix correction method to be used.

Figure 4.3. The XRFWIN material. A variety of matrix correction methods are available, including the fundamental parameters method.

Whatever matrix correction method is utilised, a comprehensive set of tools are provided for calibrating the data reduction method. This includes tools for selecting and excluding standards from the calibration, and graphing tools to ascertain validity of the calibration.

Figure 4.4. Instrument response plot of the fundamental parameters method

Results are displayed in a comprehensive list of tables. Full cutting, copying, pasting, printing, and exporting functions are available. You can also edit the material used to define the data, particularly settings related to matrix corrections in the specimen. Any changes to analysis options will result in the affected quantitative results being recalculated.

Figure 4.5. Quantitative analysis results in XRFWIN Basic. Also shown is a user-defined annotation note. Full annotation capability is available in all documents of XRFWIN.

Tube Spectrum Generation Tool

Accompanying the fundamental parameters algorithm of XRFWIN is the x-ray tube spectrum generation tool. Using sophisticated models for emission spectra of x-ray tubes, this tool can generate the x-ray radiation spectrum, including background continuum and characteristic lines, from any x-ray tube anode. Account can also be made for the inclusion of filters.

Figure 4.6. Generated x-ray tube spectrum using XRFWIN.

Support for Spectrometers

The analyzing crystals, x-ray tube, and detection geometry of the WDS spectrometer originally used to acquire the data are defined in the Generic Spectrometer Settings dialogue box. As with the full version of XRFWIN for WDS, these settings are used by analysis tools throughout the software.

Figure 4.7. Generic spectrometer settings for XRFWIN Basic for WDS.

When setting up for quantitative analysis using the XRFWIN material, general settings of the WDS spectrometer are specified in the Generic Analyte Settings dialogue box.

Figure 4.8. Generic spectrometer settings specified with other analyte settings for quantitative analysis.

XRFWIN Basic for WDS provides a variety of tools for managing the instrument. Peaks marked in a qualitative scan can be utilised by the crystal offset tool that allows a small analyzing crystal misalignment to be accounted for in software.

Figure 4.9. Crystal offset determination tool

Features

The following outline features of XRFWIN Basic for WDS by classification

Overall

  • Runs under Windows 95, 98, NT 4, 2000, ME, and XP operating systems
  • Graphical user interface makes software more intuitive
  • Context sensitive help system allows you to answer questions faster
  • Copy, print, or export to a text file almost any item of quantitative and qualitative analysis
  • Multiple document interface allows more productive use of time

Instrumentation

  • Data from any WDS spectrometer can be analyzed using the Spectrometer Import and Paste functions.
  • Crystal offset tool to correct for residual analyzing crystal misalignment
  • Characteristic line tool for quickly locating line angles for a given analyzing crystal

Qualitative Analysis

  • Qualitative scans imported or pasted into XRFWIN Basic
  • Automatic element identification tool
  • Estimate of reliability provided for identified elements
  • Atomic number grid for quick identification of unknown peaks
  • Annotation tool integrated with software simplifying the sharing of information between customers and colleagues
  • Full quantitative analysis of one or more qualitative scans
  • Easily browse characteristic lines of all elements of the periodic table
  • Comprehensive quantitative analysis tool.
  • Powerful graph display allows detailed examination of data
  • Customize graph display settings to suite your environment
  • Full printing, export, and clipboard copying capability

Quantitative Analysis

  • XRFWIN material simplifies management of instrument and data
  • Quantitative analysis data imported or pasted into XRFWIN Basic
  • Choose from a variety of matrix correction methods including:
    • Lachance and Traill
    • Lucas-Tooth and Pyne
    • Claisse and Quintin
    • Rasberry and Heinrich
    • Trace analysis by ratios
    • Direct interpolation by polynomials
    • fundamental parameters
  • Material stored with acquired data guarentees accurate reccord of all measurement conditions
  • Edit material and recalculate on the fly any time after the import or pasting of data
  • Integration of standards in material simplifies management of standards and calibration of matrix correction method
  • Range of analyte concentration validity simplifies detection of poor measurement data
  • Measurement uncertainty provided with all results
  • Instrument drift corrections obtained from drift standards included in run or a material log file.
  • Fully-integrated analyzing crystal angle determination tool simplifies setting analyte characteristic line angle
  • Accommodation for compounds by specifying analyte stoichiometry
  • Calibration of matrix correction methods simplified by comprehensive graphing interface
  • Accommodation of known constituents such as in flux preparations
  • Intensity and concentration overlap corrections integrated into material
  • Background corrections integrated into material
  • Drift corrections integrated into material
  • Results presented in easy-to-read tables
  • Customize display settings to suite your environment
  • Full printing, copying, and clipboard copying capability
  • Annotation tool integrated with software simplifying the sharing of information between customers and colleagues
  • Determine an unmeasured analyte

Fundamental Parameters

  • True FP algorithm including absorption and enhancement computed directly from the Sherman equations
  • Automatically compute x-ray tube spectra from the latest sophisticated theoretical tube spectrum models
  • Accommodate use of filters in generated tube spectra
  • Optionally use closest standard to unknown or instrument response curve determined in calibration of material
  • Use between one and as many standards as desired
  • In some cases analyze analytes for which no standards are available
  • Utilize standards completely different in composition from the unknown

 

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