Software

Omni Scientific Instruments, Inc. provides software for the automated control of XRF and XRD instumentation, and a full compliment of analytical capability for the acquired data.

The following table lists software products available from Omni Scientific Instruments, Inc.

Software

Description

TXRDWIN 5.0

Controls x-ray diffractometers and performs analysis of the results. Plug-in modules support pattern conditioning, PDF-2 search/match, quantitative analysis, etc.

XRFWIN 3.1

Controls XRF Instrumentation and performs qualitative and quantitative analysis of the acquired data. Includes the fundamental parameters method of matrix correction.

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